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Phone:   +49 (0) 5971 - 4010179

E-mail:  sales@sn-analytics.de

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QSCOPE 250 System

Futures:

scan area

40 x 40 µm

scan height

40 µm

resolution

1024

 scan mode

Z height
Lateral
Bilateral
Wave mode
Contact

We can detect roughness at a 20 x 20 µm scan in Z height mode down to Angstroem level.
We use nonotips silicon based.
If you want to analyse your surface quality, impurities on your surface and or defects, we are able to see from 20 µm large objects down to 0,1 nm.
The size of the sample can be up to 100 x 100 mm and about 20 mm thick or as small as 1 x 1 mm.

If you need just one analysis or series of some 100, please contact us for a quotation.
You can receive your scan data in print or CD format or by email.

Atomic Force Microscope

Tip of AFM

Analytical - AFM

AFM of stepped surface of an Al₂O₃ wafer after O₂ annealing

AFM of different SrTiO₃ substrates after Ti - termination

AFM of an Al₂O₃ wafer with GaN layer and a deep defect

AFM of a GaN single crystal
grown out of a GaN layer

AFM of a GaN crystal grown
through a GaN layer

AFM ofa GaN layer with growth defects resulting out of scratches in the Al2O3 substrate

AFM of a GaN layer with a large defect resulting out of resin remains on the substrate

AFM of a scratch made by
handcleaning on a Al2O3 substrate

AFM of BaTiO3 substrate with lamellas out of phase transition Stress

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